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Vol.E77-A No.1
pp.107-108
FOREWORD
FOREWORD
Kuniomi NAKAMURA, |
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Vol.E77-A No.1
pp.109-116
Special SectionPAPER
Software Reliability
Software Reliability Measurement and Assessment with Stochastic Differential Equations
Shigeru YAMADA, Mitsuhiro KIMURA, Hiroaki TANAKA, Shunji OSAKI, |
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Vol.E77-A No.1
pp.117-121
Special SectionPAPER
System Reliability
Studies of Systems Reliability Growth by the Analysis on Decreasing Rate of Unavailability
Masayoshi FURUYA, |
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Vol.E77-A No.1
pp.122-128
Special SectionPAPER
System Reliability
MTBF for Consecutive-k-out-of-n: F Systems with Nonidentical Component Availabilities
Masafumi SASAKI, Naohiko YAMAGUCHI, Tetsushi YUGE, Shigeru YANAGI, |
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Vol.E77-A No.1
pp.129-133
Special SectionPAPER
System Reliability
Reliability of a 3-State System Subject to Flow Quantity Constraint
Tetsushi YUGE, Masafumi SASAKI, Shigeru YANAGI, |
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Vol.E77-A No.1
pp.134-143
Special SectionPAPER
System Reliability
A Factored Reliability Formula for Directed Source-to-All-Terminal Networks
Yoichi HIGASHIYAMA, Hiromu ARIYOSHI, Isao SHIRAKAWA, Shogo OHBA, |
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Vol.E77-A No.1
pp.144-149
Special SectionPAPER
System Reliability
Some Remarks on MTBF's for Non-homogeneous Poisson Processes
Hirofumi KOSHIMAE, Hiroaki TANAKA, Shunji OSAKI, |
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Vol.E77-A No.1
pp.150-157
Special SectionPAPER
Failure Physics and Failure Analysis
Abnormal Epitaxial Layer of AlGaAs/GaAs Solar Cells for Space Applications
Sumio MATSUDA, Masato UESUGI, Susumu YOSHIDA, |
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Vol.E77-A No.1
pp.158-165
Special SectionPAPER
Failure Physics and Failure Analysis
A Study on Reliability and Failure Mechanism of T-Shaped Gate HEMTs
Takahide ISHIKAWA, Kenji HOSOGI, Masafumi KATSUMATA, Hiroyuki MINAMI, Yasuo MITSUI, |
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Vol.E77-A No.1
pp.166-173
Special SectionPAPER
Failure Physics and Failure Analysis
Improvement of "Soft Breakdown" Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure
Ikuo KURACHI, Yasuhiro FUKUDA, |
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Summary | Full Text:PDF | |
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Current List: 39781 - 39790
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