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Vol.E81-D No.7
pp.675-681
Special SectionPAPER
Built-in Self-Test
Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing
Kiyoshi FURUYA, Naoki NAKAMURA, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.682-688
Special SectionPAPER
IDDQ Testing
An Iterative Improvement Method for Generating Compact Tests for IDDQ Testing of Bridging Faults
Tsuyoshi SHINOGI, Terumine HAYASHI, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.689-696
Special SectionPAPER
IDDQ Testing
Test Generation for Sequential Circuits under IDDQ Testing
Toshiyuki MAEDA, Yoshinobu HIGAMI, Kozo KINOSHITA, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.697-705
Special SectionPAPER
Fault Diagnosis
Transistor Leakage Fault Diagnosis for CMOS Circuits
Xiaoqing WEN, Hideo TAMAMOTO, Kewal K. SALUJA, Kozo KINOSHITA, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.706-715
Special SectionPAPER
Fault Diagnosis
Multiple Gate Delay Fault Diagnosis Using Test-Pairs for Marginal Delays
Kwame Osei BOATENG, Hiroshi TAKAHASHI, Yuzo TAKAMATSU, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.716-723
Special SectionPAPER
Logic Simulation and Logic Optimization
On Properties of Kleene TDDs
Yukihiro IGUCHI, Tsutomu SASAO, Munehiro MATSUURA, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.724-730
Special SectionPAPER
Logic Simulation and Logic Optimization
Logic Optimization: Redundancy Addition and Removal Using Implication Relations
Hideyuki ICHIHARA, Kozo KINOSHITA, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.731-737
Special SectionPAPER
Beam Testing/Diagnosis
Guided-Probe Diagnosis of LSIs Containing Macrocells
Norio KUJI, Tadao TAKEDA, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.738-742
Special SectionPAPER
Beam Testing/Diagnosis
A New Autofocus Using Image Processing Techniques in Critical Dimension Measurement SEM
Fumio KOMATSU, Hiroshi MOTOKI, Motosuke MIYOSHI, |
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Summary | Full Text:PDF | |
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Vol.E81-D No.7
pp.743-748
Special SectionPAPER
Beam Testing/Diagnosis
Highly Sensitive OBIRCH System for Fault Localization and Defect Detection
Kiyoshi NIKAWA, Shoji INOUE, |
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Summary | Full Text:PDF | |
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Current List: 35371 - 35380
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