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Vol.E81-C No.7
pp.1112-1121
PAPER
Electronic Circuits
A 1. 9-GHz-Band Single-Chip GaAs T/R-MMIC Front-End Operating with a Single Voltage Supply of 2 V
Kazuya YAMAMOTO, Takao MORIWAKI, Yutaka YOSHI, Kenichiro CHOMEI, Takayuki FUJII, Jun OTSUJI, Yukio MIYAZAKI, Kazuo NISHITANI, |
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Vol.E81-C No.7
pp.1122-1127
PAPER
Opto-Electronics
Steady-State Analysis of Photorefractive Ring Resonator with Self-Pumped Four-Wave Mixing (PRRR-SPFWM)
Mototsugu TAKAMURA, Atsushi OKAMOTO, Kunihiro SATO, |
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Vol.E81-C No.7
pp.1128-1135
PAPER
Ultrasonic Electronics
Third Order Longitudinal Mode Piezoelectric Ceramic Transformer for High-Voltage Power Inverter
Takeshi INOUE, Mitsuru YAMAMOTO, Shingo KAWASHIMA, Seiji HIROSE, |
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Vol.E81-C No.7
pp.1136-1142
PAPER
Microwave and Millimeter Wave Technology
Cyclotron Wave Converter of Microwaves into DC
Vladimir A. VANKE, Hiroshi MATSUMOTO, Naoki SHINOHARA, Akinori KITA, |
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Vol.E81-C No.7
pp.1143-1150
PAPER
Materials
Temperature and Metal-Vapor Near Contacts in Pd Breaking Arcs by Spectroscopic Measurement
Mitsuru TAKEUCHI, Takayoshi KUBONO, |
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Vol.E81-D No.7
pp.643-644
FOREWORD
FOREWORD
Yuzo TAKAMATSU, |
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Vol.E81-D No.7
pp.645-653
Special SectionPAPER
Test Synthesis
High-Level Synthesis for Weakly Testable Data Paths
Michiko INOUE, Kenji NODA, Takeshi HIGASHIMURA, Toshimitsu MASUZAWA, Hideo FUJIWARA, |
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Vol.E81-D No.7
pp.654-659
Special SectionPAPER
Design for Testability
Improving Random Pattern Testability with Partial Circuit Duplication Approach
Hiroshi YOKOYAMA, Xiaoqing WEN, Hideo TAMAMOTO, |
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Vol.E81-D No.7
pp.660-667
Special SectionPAPER
Design for Testability
Partial Scan Design Methods Based on n-Fold Line-Up Structures and the State Justification of Pure Load/Hold Flip-Flops
Toshinori HOSOKAWA, Toshihiro HIRAOKA, Mitsuyasu OHTA, Michiaki MURAOKA, Shigeo KUNINOBU, |
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Vol.E81-D No.7
pp.668-674
Special SectionPAPER
Built-in Self-Test
On Acceleration of Test Points Selection for Scan-Based BIST
Michinobu NAKAO, Kazumi HATAYAMA, Isao HIGASHI, |
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