|
Vol.E82-B No.4
pp.664-668
LETTER
Mobile Communication
Timing Synchronization Using the Reliability Check and Smoothing Algorithm in the Fading Channels
Hyoung Kyu SONG, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.569-569
FOREWORD
FOREWORD
Hiroshi KOYAMA, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.570-575
Special SectionPAPER
Test Structure for Characterizing Capacitance Matrix of Multi-Layer Interconnects in VLSI
Tetsuhisa MIDO, Hiroshi ITO, Kunihiro ASADA, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.576-581
Special SectionPAPER
Characterisation of Offset Lithographic Films Using Microelectronic Test Structures
Anthony J. WALTON, J. Tom M. STEVENSON, Leslie I. HAWORTH, Martin FALLON, Peter S. A. EVANS, Blue J. RAMSEY, David HARRISON, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.582-588
Special SectionPAPER
A Complete Methodology for Electro-Mechanical Characterization of a CMOS Compatible MEMS Technology
Laurent LATORRE, Pascal NOUET, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.589-592
Special SectionPAPER
Characterization of Extrinsic Oxide Breakdown on Thin Dielectric Oxide
Katsuya SHIGA, Junko KOMORI, Masafumi KATSUMATA, Akinobu TERAMOTO, Yoji MASHIKO, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.593-601
Special SectionPAPER
A Study on Hot-Carrier-Induced Photoemission in n-MOSFETs
Toshihiro MATSUDA, Naoko MATSUYAMA, Kiyomi HOSOI, Etsumasa KAMEDA, Takashi OHZONE, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.602-606
Special SectionPAPER
A New Simple Method for Extracting the Capacitance Coupling Coefficients of Sub-0.5-µm Flash Memory Cells
Keiichi HARAGUCHI, Hitoshi KUME, Masahiro USHIYAMA, Makoto OHKURA, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.607-611
Special SectionPAPER
Determination of Base and Emitter Resistances in Bipolar Junction Transistors from Low Frequency Noise and Static Measurements
Pierre LLINARES, Gerard GHIBAUDO, Yannick MOURIER, Nicolas GAMBETTA, Michel LAURENS, Jan A. CHROBOCZEK, |
|
Summary | Full Text:PDF | |
|
Vol.E82-C No.4
pp.612-617
Special SectionPAPER
New Test Structures for Evaluating the Scaling Limit of a Narrow U-Groove Isolation Structure
Yoichi TAMAKI, Takashi HASHIMOTO, |
|
Summary | Full Text:PDF | |
| Current List: 34461 - 34470
|
|