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Vol.E82-C No.6
pp.924-936
INVITED PAPER
Measurement-Based Mathematical Active Device Modeling for High Frequency Circuit Simulation
David E. ROOT, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.937-947
INVITED PAPER
Mesh Generation for Application in Technology CAD
Peter FLEISCHMANN, Wolfgang PYKA, Siegfried SELBERHERR, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.948-954
INVITED PAPER
A Design Hierarchy of IC Interconnects and Gate Patterns
Shinji ODANAKA, Akio MISAKA, Kyoji YAMASHITA, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.955-966
Special SectionPAPER
Non-uniform Multi-Layer IC Interconnect Transmission Line Characterization for Fast Signal Transient Simulation of High-Speed/High-Density VLSI Circuits
Woojin JIN, Hanjong YOO, Yungseon EO, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.967-975
INVITED PAPER
Modeling and Characterization of Ultra Deep Submicron CMOS Devices
Narain D. ARORA, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.976-982
INVITED PAPER
TCAD Needs and Applications from a User's Perspective
Michael DUANE, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.983-991
INVITED PAPER
Process Synthesis Using TCAD: A Mixed-Signal Case Study
Michael SMAYLING, John RODRIGUEZ, Alister YOUNG, Ichiro FUJII, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.992-996
INVITED PAPER
Equipment Simulation of Production Reactors for Silicon Device Fabrication
Christoph WERNER, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.997-1002
Special SectionPAPER
Worst/Best Device and Circuit Performances for MOSFETs Determined from Process Fluctuations
Odin PRIGGE, Masami SUETAKE, Mitiko MIURA-MATTAUSCH, |
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Summary | Full Text:PDF | |
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Vol.E82-C No.6
pp.1003-1012
PAPER
Integrated Electronics
Automatic Defect Pattern Detection on LSI Wafers Using Image Processing Techniques
Kazuyuki MARUO, Tadashi SHIBATA, Takahiro YAMAGUCHI, Masayoshi ICHIKAWA, Tadahiro OHMI, |
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Summary | Full Text:PDF | |
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Current List: 34391 - 34400
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