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IEICE Trans

Keyword : test wrapper design

NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
Fawnizu Azmadi HUSSIN Tomokazu YONEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/07/01
Vol. E91-D  No. 7 ; pp. 2008-2017
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SoC testing, NoC testing, test wrapper design, NoC-compatible wrapper, 
 Summary | Full Text:PDF