Fawnizu Azmadi HUSSIN

NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints
Fawnizu Azmadi HUSSIN Tomokazu YONEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/07/01
Vol. E91-D  No. 7  pp. 2008-2017
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SoC testing, NoC testing, test wrapper design, NoC-compatible wrapper, 
 Summary | Full Text:PDF
On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time
Fawnizu Azmadi HUSSIN Tomokazu YONEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/07/01
Vol. E91-D  No. 7  pp. 1999-2007
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SoC test scheduling, test wrapper, test access mechanism, NoC-reuse, bandwidth sharing, 
 Summary | Full Text:PDF
Scheduling Power-Constrained Tests through the SoC Functional Bus
Fawnizu Azmadi HUSSIN Tomokazu YONEDA Alex ORAILOLU Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 736-746
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: High-Level Testing
Keyword: 
functional bus, functional TAM, power-constrained, packet-based scheduling, system-on-chip testing, 
 Summary | Full Text:PDF