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IEICE Trans

Keyword : self-test

A Self-Test of Dynamically Reconfigurable Processors with Test Frames
Tomoo INOUE Takashi FUJII Hideyuki ICHIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 756-762
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: High-Level Testing
Keyword: 
dynamically reconfigurable processors, self-test, optimal contexts, test application time, test frames, 
 Summary | Full Text:PDF