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IEICE Trans

Keyword : open node defect

Detection of CMOS Open Node Defects by Frequency Analysis
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/03/01
Vol. E90-D  No. 3 ; pp. 685-687
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
current test, open node defect, floating gate defect, frequency analysis, 
 Summary | Full Text:PDF