Tsutomu HONDO

Detection of CMOS Open Node Defects by Frequency Analysis
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/03/01
Vol. E90-D  No. 3  pp. 685-687
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
current test, open node defect, floating gate defect, frequency analysis, 
 Summary | Full Text:PDF
CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Toshifumi KOBAYASHI Tsutomu HONDO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 551-556
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
current test, floating gate defect, open defect, defect detection, 
 Summary | Full Text:PDF