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IEICE Trans

Keyword : memory reliability

Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair
Gian MAYUGA Yuta YAMATO Tomokazu YONEDA Yasuo SATO Michiko INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/10/01
Vol. E99-D  No. 10 ; pp. 2591-2599
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
memory repair, memory reliability, in-field test and repair, ECC, in-field repair strategy, remapping, 
 Summary | Full Text:PDF