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IEICE Trans

Keyword : fault model

Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Yuzo TAKAMATSU Hiroshi TAKAHASHI Yoshinobu HIGAMI Takashi AIKYO Koji YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 675-682
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
diagnosis, fault model, fault location, fault simulation, combinational circuits, pass/fail information, 
 Summary | Full Text:PDF
A New Diagnostic Method Using Probabilistic Temporal Fault Models
Kazuo HASHIMOTO Kazunori MATSUMOTO Norio SHIRATORI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/03/01
Vol. E85-D  No. 3 ; pp. 444-454
Type of Manuscript:  INVITED PAPER (Special Issue on the 2000 IEICE Excellent Paper Award)
Category: Artificial Intelligence,Cognitive Science
Keyword: 
model-based diagnosis, fault model, probabilistic temporal logic, Akaike information criterion, 
 Summary | Full Text:PDF
A Fault Model for Multiple-Valued PLA's and Its Equivalences
Yasunori NAGATA Masao MUKAIDONO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/09/25
Vol. E77-A  No. 9 ; pp. 1527-1534
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
equivalences of faults, fault model, multiple-valued logic, programmable logic array, test compaction, 
 Summary | Full Text:PDF