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Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Yuzo TAKAMATSU Hiroshi TAKAHASHI Yoshinobu HIGAMI Takashi AIKYO Koji YAMAZAKI
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
diagnosis, fault model, fault location, fault simulation, combinational circuits, pass/fail information,
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In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.