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IEICE Trans

Keyword : easily testable

Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τk-Notation
Chia Yee OOI Thomas CLOUQUEUR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8 ; pp. 1202-1212
Type of Manuscript:  PAPER
Category: Complexity Theory
Keyword: 
easily testable, stuck-at faults, path delay faults, test generation complexity, 
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