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IEICE Trans

Keyword : delay test

On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation
A.K.M. Mahfuzul ISLAM Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 1971-1979
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
process shift, process spread, monitor structure, post-silicon analysis, delay test, adaptive test, 
 Summary | Full Text:PDF
Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation
Jing-Jia LIOU Li-C. WANG Angela KRSTIĆ Kwang-Ting (Tim) CHENG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12 ; pp. 3038-3048
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Timing Verification and Test Generation
Keyword: 
delay test, critical path, statistical timing analysis, 
 Summary | Full Text:PDF