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| Keyword : defect oriented testing
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Ramp Voltage Testing for Detecting Interconnect Open Faults
Yukiya MIURA | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D
No. 3 ;
pp. 700-705
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword:
CMOS circuits, defect oriented testing, open faults, ramp voltage, | | | Summary | Full Text:PDF | |
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