Keyword : defect oriented testing


Ramp Voltage Testing for Detecting Interconnect Open Faults
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 700-705
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
CMOS circuitsdefect oriented testingopen faultsramp voltage
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