A Multi-Code Compression Scheme for Test Time Reduction of System-on-Chip Designs Hong-Ming SHIEHJin-Fu LI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/10/01 Vol. E91-DNo. 10 ;
pp. 2428-2434 Type of Manuscript: PAPER Category: Dependable Computing Keyword: system-on-chip, test, compression, multi-code compression, decompression,