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IEICE Trans

Keyword : ambiguous delay model

Diagnosing Delay Faults in Combinational Circuits Under the Ambiguous Delay Model
Kwame Osei BOATENG Hiroshi TAKAHASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/12/25
Vol. E82-D  No. 12 ; pp. 1563-1571
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
combinational circuit, ambiguous delay model, multiple fault diagnosis, path-tracing method, 
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