Keyword : path-tracing method


Diagnosing Delay Faults in Combinational Circuits Under the Ambiguous Delay Model
Kwame Osei BOATENG Hiroshi TAKAHASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/12/25
Vol. E82-D  No. 12 ; pp. 1563-1571
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
combinational circuitambiguous delay modelmultiple fault diagnosispath-tracing method
 Summary | Full Text:PDF

Multiple Gate Delay Fault Diagnosis Using Test-Pairs for Marginal Delays
Kwame Osei BOATENG Hiroshi TAKAHASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 706-715
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Fault Diagnosis
Keyword: 
combinational circuitfault diagnosismultiple delay faultdiagnostic rulespath-tracing methodtest-pairs for marginal delays
 Summary | Full Text:PDF