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IEICE Trans

Keyword : SoC test

Design and Optimization of Transparency-Based TAM for SoC Test
Tomokazu YONEDA Akiko SHUTO Hideyuki ICHIHARA Tomoo INOUE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/06/01
Vol. E93-D  No. 6 ; pp. 1549-1559
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
SoC test, design for testability, TAM design, transparency, ILP, 
 Summary | Full Text:PDF
Selective Scan Slice Grouping Technique for Efficient Test Data Compression
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/02/01
Vol. E93-D  No. 2 ; pp. 380-383
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT), scan testing, SoC test, test data compression, 
 Summary | Full Text:PDF