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IEICE Trans

Keyword : SOC testing

Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/03/01
Vol. E89-D  No. 3 ; pp. 1157-1164
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
concurrent testing, SOC testing, test cost reduction, test data compression, 
 Summary | Full Text:PDF
Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores
Yinhe HAN Yu HU Xiaowei LI Huawei LI Anshuman CHANDRA Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/09/01
Vol. E88-D  No. 9 ; pp. 2126-2134
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SOC testing, wrapper design, scan slices, overlapping, 
 Summary | Full Text:PDF
X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/07/01
Vol. E88-D  No. 7 ; pp. 1662-1670
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SOC testing, test cost reduction, test data compression, unknown state, test diagnosis, 
 Summary | Full Text:PDF