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IEICE Trans

Keyword : C-testability

A C-Testable Multiple-Block Carry Select Adder
Nobutaka KITO Shinichi FUJII Naofumi TAKAGI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/04/01
Vol. E95-D  No. 4 ; pp. 1084-1092
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
carry select adder, design for testability, C-testability, 
 Summary | Full Text:PDF
A C-Testable 4-2 Adder Tree for an Easily Testable High-Speed Multiplier
Nobutaka KITO Kensuke HANAI Naofumi TAKAGI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/10/01
Vol. E93-D  No. 10 ; pp. 2783-2791
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
multiplier, design for testability, 4-2 adder tree, C-testability, 
 Summary | Full Text:PDF