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IEICE Trans

Keyword : temperature variation

Subthreshold SRAM with Write Assist Technique Using On-Chip Threshold Voltage Monitoring Circuit
Kei MATSUMOTO Tetsuya HIROSE Yuji OSAKI Nobutaka KUROKI Masahiro NUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6 ; pp. 1042-1048
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
SRAM, threshold voltage variation, compensation circuit, process variation, temperature variation, PVT variation, 
 Summary | Full Text:PDF