Keyword : threshold voltage variation

Subthreshold SRAM with Write Assist Technique Using On-Chip Threshold Voltage Monitoring Circuit
Kei MATSUMOTO Tetsuya HIROSE Yuji OSAKI Nobutaka KUROKI Masahiro NUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6 ; pp. 1042-1048
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
SRAM, threshold voltage variation, compensation circuit, process variation, temperature variation, PVT variation, 
 Summary | Full Text:PDF
An On-Chip PVT Compensation Technique with Current Monitoring Circuit for Low-Voltage CMOS Digital LSIs
Yusuke TSUGITA Ken UENO Tetsuya HIROSE Tetsuya ASAI Yoshihito AMEMIYA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6 ; pp. 835-841
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
digital circuits, threshold voltage variation, compensation circuit, PVT variation, 
 Summary | Full Text:PDF
Estimation of Yield Suppression for 1.5 V-1 Gbit DRAMs Caused by Threshold Voltage Variation of MOSFET due to Microscopic Fluctuation in Dopant Distributions
Shigeyoshi WATANABE Takaaki MINAMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2 ; pp. 273-279
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
1 Gbit DRAM, 1.5 V, yield, threshold voltage variation, redundancy, 
 Summary | Full Text:PDF