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IEICE Trans

Keyword : pseudo-floating gate test structure

A New Characterization Method for Accurate Capacitor Matching Measurements Using Pseudo-Floating Gate Test Structures in Submicron CMOS and BICMOS Technologies
Olivier ROUX dit BUISSON Gerard MORIN Frederic PAILLARDET Eric MAZALEYRAT 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4 ; pp. 624-629
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
capacitor matching, CMOS, BiCMOS, pseudo-floating gate test structure, 
 Summary | Full Text:PDF