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IEICE Trans

Keyword : positive bias temperature instability (PBTI)

Reducing Aging Effects on Ternary CAM
Ing-Chao LIN Yen-Han LEE Sheng-Wei WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/07/01
Vol. E99-C  No. 7 ; pp. 878-891
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
ternary content addressable memory (CAM), negative bias temperature instability (NBTI), positive bias temperature instability (PBTI), reliability, power gating, 
 Summary | Full Text:PDF