Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C
No. 4 ;
pp. 483-491
Type of Manuscript:
Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: Keyword: worst-case design, timing error, co-simulation, parameter variation, |