Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/03/01 Vol. E89-CNo. 3 ;
pp. 364-369 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era) Category: Signal Integrity and Variability Keyword: substrate noise, di/dt, feedforward active cancelling, anti-phase, ground bounce, di/dt detector,