Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-CNo. 5 ;
pp. 817-823 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: capacitance, CV, gate dielectric, impedance, MOSFET, nitride, oxide, RF, S-parameters,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/01/01 Vol. E87-CNo. 1 ;
pp. 37-43 Type of Manuscript: Special Section PAPER (Special Section on High-κ Gate Dielectrics) Category: Keyword: high-κ, HfO2, gate dielectric, thermal stability,