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IEICE Trans

Keyword : error indicators

Comparison between a posteriori Error Indicators for Adaptive Mesh Generation in Semiconductor Device Simulation
Katsuhiko TANAKA Paolo CIAMPOLINI Anna PIERANTONI Giorgio BACCARANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2 ; pp. 214-219
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Numerics
Keyword: 
device simulation, mesh generation, error indicators, 
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