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IEICE Trans

Keyword : drift-diffusion model

Nonlocal Impact Ionization Model and Its Application to Substrate Current Simulation of n-MOSFET's
Ken-ichiro SONODA Mitsuru YAMAJI Kenji TANIGUCHI Chihiro HAMAGUCHI Tatsuya KUNIKIYO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/03/25
Vol. E78-C  No. 3 ; pp. 274-280
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies)
Category: 
Keyword: 
nonlocal impact ionization, substrate current, Monte Carlo simulation, device simulation, drift-diffusion model, 
 Summary | Full Text:PDF