An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults Jin-Fu LIChao-Da HUANG
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2007/12/01 Vol. E90-ANo. 12 ;
pp. 2703-2711 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Memory Design and Test Keyword: diagnosis, random access memories, March test, built-in self-diagnosis, coupling faults,