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Keyword : stuck-at faults March test algorithm
An Efficient Fault Syndromes Simulator for SRAM Memories
Wan Zuha WAN HASAN
Izhal ABD HALIN
Roslina MOHD SIDEK
Masuri OTHMAN
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
2009/05/01
Vol.
E92-C
No.
5
;
pp.
639-646
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
testing
,
diagnosis
,
coupling faults
,
stuck-at faults March test algorithm
,
built-in self-test (BIST)
,
built-in self-diagnosis (BISD)
,
automated march-based test algorithm
,
SRAM
,
Summary
|
Full Text:PDF