Keyword : stuck-at faults March test algorithm

An Efficient Fault Syndromes Simulator for SRAM Memories
Wan Zuha WAN HASAN Izhal ABD HALIN Roslina MOHD SIDEK Masuri OTHMAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 639-646
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
testing, diagnosis, coupling faults, stuck-at faults March test algorithm, built-in self-test (BIST), built-in self-diagnosis (BISD), automated march-based test algorithm, SRAM, 
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