Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/05/01 Vol. E85-CNo. 5 ;
pp. 1138-1145 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: boron penetration, gate depletion, dual-gate PMOSFETs, Vth fluctuation, G-bit DRAM,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1995/03/25 Vol. E78-CNo. 3 ;
pp. 255-260 Type of Manuscript: Special Section PAPER (Special Issue on Sub-1/4 Micron Device and Process Technologies) Category: Keyword: hot-carrier effects, boron penetration, surface-channel PMOSFETs, gate current, BF2,