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IEICE Trans

Keyword : Inter-die variation

A 0.15-µm FD-SOI Substrate Bias Control SRAM with Inter-Die Variability Compensation Scheme
Shunsuke OKUMURA Hidehiro FUJIWARA Kosuke YAMAGUCHI Shusuke YOSHIMOTO Masahiko YOSHIMOTO Hiroshi KAWAGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 579-585
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
SRAM, FD-SOI, Inter-die variation, 
 Summary | Full Text:PDF