Publication: IEICE TRANSACTIONS on Communications Publication Date: 2023/10/01 Vol. E106-BNo. 10 ;
pp. 969-978 Type of Manuscript: PAPER Category: Electromagnetic Compatibility(EMC) Keyword: IC, digital control circuit, conducted immunity, threshold, test method,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2012/02/01 Vol. E95-DNo. 2 ;
pp. 303-313 Type of Manuscript: Special Section PAPER (Special Section on Reconfigurable Systems) Category: Architecture Keyword: design for testability, homogeneous architecture, test method, prototype chip,