Yoshinobu ICHIDA


Highly Reliable Non-volatile Logic Circuit Technology and Its Application
Hiromitsu KIMURA Zhiyong ZHONG Yuta MIZUOCHI Norihiro KINOUCHI Yoshinobu ICHIDA Yoshikazu FUJIMORI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/09/01
Vol. E97-D  No. 9  pp. 2226-2233
Type of Manuscript:  INVITED PAPER (Special Section on Multiple-Valued Logic and VLSI Computing)
Category: 
Keyword: 
non-volatile logicnon-volatile flip-flopferroelectric capacitorhigh reliabilitydata protection
 Summary | Full Text:PDF

An Easily Testable Routing Architecture and Prototype Chip
Kazuki INOUE Masahiro KOGA Motoki AMAGASAKI Masahiro IIDA Yoshinobu ICHIDA Mitsuro SAJI Jun IIDA Toshinori SUEYOSHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/02/01
Vol. E95-D  No. 2  pp. 303-313
Type of Manuscript:  Special Section PAPER (Special Section on Reconfigurable Systems)
Category: Architecture
Keyword: 
design for testabilityhomogeneous architecturetest methodprototype chip
 Summary | Full Text:PDF

A Genuine Power-Gatable Reconfigurable Logic Chip with FeRAM Cells
Masahiro IIDA Masahiro KOGA Kazuki INOUE Motoki AMAGASAKI Yoshinobu ICHIDA Mitsuro SAJI Jun IIDA Toshinori SUEYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4  pp. 548-556
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
reconfigurable logicFeRAMpower-gatingnon-volatile flip-flopNV-FFVGLC
 Summary | Full Text:PDF