Publication: IEICE TRANSACTIONS on Communications Publication Date: 2015/12/01 Vol. E98-BNo. 12 ;
pp. 2477-2484 Type of Manuscript: PAPER Category: Electromagnetic Compatibility(EMC) Keyword: ESD, immunity test, control board, PWM signal, photo-coupler,
FDTD Simulation Based on Spark Resistance Formula for Electromagnetic Fields due to Spark between Charged Metal Bars with Ferrite Core Attachment Soichiro TAIRAOsamu FUJIWARA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/03/01 Vol. E86-CNo. 3 ;
pp. 404-408 Type of Manuscript: Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02)) Category: Keyword: ESD, contact resistance, simulation, heating,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2001/06/01 Vol. E84-CNo. 6 ;
pp. 823-831 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: LDMOSFET, ESD, static discharge, thick SOI,
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2000/03/25 Vol. E83-BNo. 3 ;
pp. 608-612 Type of Manuscript: Special Section LETTER (Special Issue on Recent Progress in Electromagnetic Compatibility Technology) Category: Keyword: ESD, estimation of current waveform, inverse problem,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/03/25 Vol. E80-CNo. 3 ;
pp. 455-463 Type of Manuscript: Special Section PAPER (Special Issue on SOI Devices and Their Process Technologies) Category: Keyword: CMOS, SOI, low voltage, LVTTL-compatible, ESD,
Test Structures and a Modified Transmission Line Pulse System for the Study of Electrostatic Discharge Robert A. ASHTON
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 158-164 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: integrated electronics, semiconductor materials and devices, ESD, test structures, reliability,