Yoshinori TAKA


Verification of Spark-Resistance Formulae for Micro-Gap ESD
Yoshinori TAKA Osamu FUJIWARA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/07/01
Vol. E93-B  No. 7  pp. 1801-1806
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'09/Kyoto)
Category: ESD and Transients
Keyword: 
micro-gap ESDsspark-resistance formulaeRompe-WeizelToeplervalidation
 Summary | Full Text:PDF

Estimation of Potential Gradient from Discharge Current through Hand-Held Metal Piece from Charged Human Body
Yoshinori TAKA Osamu FUJIWARA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/07/01
Vol. E93-B  No. 7  pp. 1797-1800
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'09/Kyoto)
Category: ESD and Transients
Keyword: 
electrostatic dischargecharged human bodydischarge currentgap potential gradient
 Summary | Full Text:PDF

A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable
Ken KAWAMATA Shigeki MINEGISHI Yoshinori TAKA Osamu FUJIWARA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2009/06/01
Vol. E92-B  No. 6  pp. 1965-1968
Type of Manuscript:  Special Section PAPER (Special Section on 3rd Pan-Pacific EMC Joint Meeting -- PPEMC'08--)
Category: 
Keyword: 
ESDmicro-gap dischargefast transientsband-limitingtransmission lineestimation
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A 130-nm CMOS 95-mm2 1-Gb Multilevel AG-AND-Type Flash Memory with 10-MB/s Programming Throughput
Hideaki KURATA Shunichi SAEKI Takashi KOBAYASHI Yoshitaka SASAGO Tsuyoshi ARIGANE Keiichi YOSHIDA Yoshinori TAKASE Takayuki YOSHITAKE Osamu TSUCHIYA Yoshinori IKEDA Shunichi NARUMI Michitaro KANAMITSU Kazuto IZAWA Kazunori FURUSAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/10/01
Vol. E89-C  No. 10  pp. 1469-1479
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
flash memoryAG-ANDmultilevelhigh speed programmingCCIP
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Silicon Resonant Tunneling Metal-Oxide-Semiconductor Transistor for Sub-0.1 µm Era
Naoto MATSUO Yoshinori TAKAMI Takahiro NOZAKI Hiroki HAMADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5  pp. 1086-1090
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Sub-0.1 µm CMOS Devices)
Category: 
Keyword: 
SRTMOSTsub-0.1 µmlogic circuit
 Summary | Full Text:PDF