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IEICE Trans

Keyword : shorted nets fault

Complete Diagnosis Patterns for Wiring Interconnects
Sungju PARK Gueesang LEE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1998/04/25
Vol. E81-A  No. 4 ; pp. 672-676
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
boundary scan, shorted nets fault, stuck-at fault, fault detection, fault diagnosis, interconnect test, 
 Summary | Full Text:PDF