MINT--An Exact Algorithm for Finding Minimum Test Set-- Yusuke MATSUNAGA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1993/10/25 Vol. E76-ANo. 10 ;
pp. 1652-1658 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: test pattern generation, minimum test set, binary decision diagram, minimum set covering problem,