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IEICE Trans

Yusuke KIUCHI

Analysis and Evaluation of Electromagnetic Interference between ThruChip Interface and LC-VCO
Junichiro KADOMOTO So HASEGAWA Yusuke KIUCHI Atsutake KOSUGE Tadahiro KURODA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/06/01
Vol. E99-C  No. 6  pp. 659-662
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
TCI, 3D integration, LC-VCO, EMI, 
 Summary | Full Text:PDF