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IEICE Trans

Youngmin CHO

DFV-Aware Flip-Flops Using C-Elements
Changnoh YOON Youngmin CHO Jinsang KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/07/01
Vol. E94-C  No. 7  pp. 1229-1232
Type of Manuscript:  BRIEF PAPER
Category: Electronic Circuits
Keyword: 
design-for-variability, flip-flop, nanometer process, PVT variation, single event upset, 
 Summary | Full Text:PDF