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IEICE Trans

Youbean KIM


Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
Youbean KIM Jaewon JANG Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/03/01
Vol. E93-D  No. 3  pp. 643-646
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
BISTlow power BISTdesign for testability
 Summary | Full Text:PDF

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
Youbean KIM Kicheol KIM Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10  pp. 1713-1716
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-signal testPLL (phase-locked loops)BIST (built-in self test)DFT (design for testability)
 Summary | Full Text:PDF

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
Kicheol KIM Youbean KIM Incheol KIM Hyeonuk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4  pp. 670-672
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
ADC testingBISThistogram testing
 Summary | Full Text:PDF

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
Youbean KIM Kicheol KIM Incheol KIM Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1185-1188
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
low power BIST (Built-in Self Test)pseudo-random BISTlow power pattern generator
 Summary | Full Text:PDF

A New Analog-to-Digital Converter BIST Considering a Transient Zone
Incheol KIM Kicheol KIM Youbean KIM HyeonUk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/11/01
Vol. E90-C  No. 11  pp. 2161-2163
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
static ADC built-in self-testtransient zone problem
 Summary | Full Text:PDF