Keyword : mixed-signal test


A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
Youbean KIM Kicheol KIM Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10 ; pp. 1713-1716
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
mixed-signal testPLL (phase-locked loops)BIST (built-in self test)DFT (design for testability)
 Summary | Full Text:PDF

An Effective Built-In Self-Test for Chargepump PLL
Junseok HAN Dongsup SONG Hagbae KIM YoungYong KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/08/01
Vol. E88-C  No. 8 ; pp. 1731-1733
Type of Manuscript:  Special Section LETTER (Special Section on Papers Selected from AP-ASIC 2004)
Category: 
Keyword: 
mixed-signal testBISTPLL
 Summary | Full Text:PDF