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IEICE Trans

Xiaoxin CUI

Low Power High Performance FinFET Standard Cells Based on Mixed Back Biasing Technology
Tian WANG Xiaoxin CUI Kai LIAO Nan LIAO Xiaole CUI Dunshan YU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/08/01
Vol. E99-C  No. 8  pp. 974-983
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
VLSI, FinFET, standard cell, stacking, back biasing, 
 Summary | Full Text:PDF