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IEICE Trans

Xiang FU

Testable Critical Path Selection Considering Process Variation
Xiang FU Huawei LI Xiaowei LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1  pp. 59-67
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
testable critical path selection, process variation, 
 Summary | Full Text:PDF