Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis Tsutomu INAMOTOYoshinobu HIGAMI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2020/12/01 Vol. E103-ANo. 12pp. 1456-1463 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: LSI testing, circuit fault diagnosis, set cover problem, greedy heuristic, fault-pair,