Keyword : set cover problem


Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis
Tsutomu INAMOTO Yoshinobu HIGAMI 
Publication:   
Publication Date: 2020/12/01
Vol. E103-A  No. 12 ; pp. 1456-1463
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
LSI testingcircuit fault diagnosisset cover problemgreedy heuristicfault-pair
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